Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Diffusion of vanadium, chromium, and manganese in copper

Journal Article · · Metall. Trans., A; (United States)
DOI:https://doi.org/10.1007/BF02661758· OSTI ID:7301151
 [1]; ;
  1. Sumitomo Metal Mining Co., Ltd., Ichikawa, Japan

The diffusion coefficients of vanadium, chromium and manganese in copper have been determined by the residual activity method with radioactive tracers /sup 48/V, /sup 51/Cr and /sup 54/Mn in the temperature ranges between 955 and 1342 K, between 999 and 1338 K and between 971 and 1253 K, respectively. The temperature dependence of the diffusion coefficients is expressed by the following Arrhenius equations along with the probable errors: D/sub V/Cu/ = (2.48/sup +0/./sup 53//sub -0.44) x 10/sup -4/ exp (-(215 +- 2) kJ mol/sup -1//RT) m/sup 2/ per s, D/sub Cr/Cu/ = (0.337/sup +0/./sup 124//sub -0.090) x 10/sup -4/ exp (-(195 +- 3) kJ mol/sup -1//RT) m/sup 2/ per s, D/sub Mn/Cu/ = (1.02/sup +0/./sup 22//sub -0.18/) x 10/sup -4/ exp (-(200 +- 2) kJ mol/sup -1//RT) m/sup 2/ per s. Anomalous penetration profiles for the diffusion of /sup 51/Cr and /sup 54/Mn in the present results suggest that experimental results on D/sub Cr/Cu/ and D/sub Mn/Cu/ in the past have been influenced by oxidation and evaporation of the chemically active radiotracers during annealing for diffusion.

OSTI ID:
7301151
Journal Information:
Metall. Trans., A; (United States), Journal Name: Metall. Trans., A; (United States) Vol. 8:3; ISSN MTTAB
Country of Publication:
United States
Language:
English