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DC modeling and characterization of AlGaAs/GaAs heterojunction bipolar transistors for high-temperature applications

Journal Article · · IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/4.272113· OSTI ID:7300973
; ;  [1]
  1. Washington State Univ., Pullman, WA (United States). School of Electrical Engineering and Computer Science

There is currently a demand for active electronic devices operating reliably over wide range of temperatures. Potential applications for the high-temperature devices and integrated circuits are in the areas of jet engine and control instrumentation for nuclear power plants. Here, the large signal dc characteristics of AlGaAs/GaAs heterojunction bipolar transistors (HBT) at high temperatures (27--300 C) are reported. A high-temperature SPICE model is developed which includes the recombination-generation current components and avalanche multiplication which become extremely important at high temperatures. The effect of avalanche breakdown is also included to model the current due to thermal generation of electron/hole pairs causing breakdown at high temperatures. A parameter extraction program is developed used to extract the model parameters of HBT's at different temperatures. Fitting functions for the model parameters as a function of temperature are developed. These parameters are then used in the SPICE Ebers-Moll model for the dc characterization of the HBT at any temperature between (27--300 C).

OSTI ID:
7300973
Journal Information:
IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States) Vol. 29:2; ISSN IJSCBC; ISSN 0018-9200
Country of Publication:
United States
Language:
English