Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Artificially layered Bi[sub 2]Sr[sub 2]Ca[sub n[minus]1]Cu[sub n]O[sub 2n+4] (n [ge] 3) films by sequential sputter deposition

Conference · · Journal of Superconductivity; (United States)
OSTI ID:7268124
;  [1]
  1. National Research Inst. for Metals, Ibaraki (Japan)
Uniformly layered mixture of the succeeding members in the structure series was found in artificially layered Bi[sub 2]Sr[sub 2]Ca[sub n[minus]1]Cu[sub n]O[sub 2n+4] films synthesized by a three-target sequential sputter deposition technique. The intergrowth structure was quantitatively evaluated by X-ray analysis technique. An averaged e-axis (half) unit length and a plane spacing d[sub 0][approx equal]0.31 nm ([approx equal]d[sub CaCuO(2)]) in the intergrowth structure are considered as a modulation wavelength and an average lattice of superlattice in the analysis. It is shown that the X-ray diffraction patterns observed in our films are in good agreement with that predicted by the superlattice model. 5 refs., 2 figs.
OSTI ID:
7268124
Report Number(s):
CONF-930710--
Conference Information:
Journal Name: Journal of Superconductivity; (United States) Journal Volume: 7:1
Country of Publication:
United States
Language:
English