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Investigation of efficiency limiting defects and rapid thermal processing of MOCVD grown CdTe solar cells

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
OSTI ID:7258249
; ; ;  [1]
  1. School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States)
CdTe solar cells were fabricated by depositing CdTe films on CdS/SnO[sub 2]/glass substrates using metalorganic chemical vapor deposition (MOCVD) with varying Te/Cd mole ratio in the growth ambient. Auger electron spectroscopy (AES) revealed a high degree of atomic interdiffusion at the CdS/CdTe interface when the CdTe films were grown in the Te-rich conditions. The open-circuit voltage of 780 mV and cell efficiency of 11.9% were found to be the highest for the Te-rich growth ambient, suggesting that the enhanced interdiffusion in these cells leads to the gradual transition from CdS to CdTe and fewer interface states. The high effective life-time of the charge carriers in the bulk material, measured by time-resolved photoluminescence, also supports the hypothesis of reduced defect density in the CdTe cells grown in the Te-rich ambient. In order to eliminate possible Cl-related defects in CdTe, Rapid Thermal Processing (RTP) of CdS/CdTe films was done to achieve grain regrowth without the use of CdCl[sub 2] as a fluxing agent. A cell efficiency of 10.7% was recorded using RTP. Finally, a set of experiments and some model simulations were performed to determine losses due to absorption and reflection in CdS/CdTe solar cells as a function of the CdS layer thickness.
OSTI ID:
7258249
Report Number(s):
CONF-9310273--
Conference Information:
Journal Name: AIP Conference Proceedings (American Institute of Physics); (United States) Journal Volume: 306:1
Country of Publication:
United States
Language:
English