Method of determining the x-ray limit of an ion gauge

Patent · Tue Nov 24 04:00:00 EST 1981

OSTI ID:7243807

Edwards, D Jr; Lanni, C P

An ion gauge having a reduced x-ray limit'' and means for measuring that limit are disclosed. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage. The x-ray limit'' (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula given in equation 1 where: I[sub x] = x-ray limit'', I[sub l] and I[sub h] = the collector current at the lower and higher grid voltage respectively; and, [alpha] = the ratio of the collector current due to positive ions at the higher voltage to that at the lower voltage. 2 figs.

• Assignee: Dept. of Energy, Washington, DC (United States)
• Patent Number(s): US 4302679; A
• Application Number: PPN: US 6-064594
• OSTI ID: 7243807
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CATIONS
CHARGED PARTICLES
ELECTRIC POTENTIAL
ELECTROMAGNETIC RADIATION
IONIZATION CHAMBERS
IONIZING RADIATIONS
IONS
LIMITING VALUES
MEASURING INSTRUMENTS
MEASURING METHODS
OPERATION
RADIATION DETECTORS
RADIATIONS
X RADIATION