Advanced processing and characterization of semiconductors III
Conference
·
OSTI ID:7241560
This book presents the papers given at a conference on semiconductor materials. Topics considered at the conference included the structural characterization of defects in GaAs with ultrasonic measurements, the characterization of electron traps resulting from oxygen precipitation in Cz silicon, the pulsed laser processing of silicon by means of absorption by free carriers, rapid thermal annealing and solid phase epitaxy of ion implanted InP, opto-electronic effects, the epitaxial growth of semiconductors on stabilized zirconia single crystals, structure and electrical properties of metal-GaAs interfaces, and tantallum and niobium silicides formed by scanning electron beams.
- OSTI ID:
- 7241560
- Report Number(s):
- CONF-860117-
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360000* -- Materials
ABSORPTION
ABSTRACTS
ACOUSTIC TESTING
ANNEALING
ARSENIC COMPOUNDS
ARSENIDES
BEAMS
CHALCOGENIDES
CRYSTALS
DOCUMENT TYPES
ELECTRICAL PROPERTIES
ELECTRO-OPTICAL EFFECTS
ELECTRON BEAMS
ELEMENTS
EPITAXY
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
HEAT TREATMENTS
INDIUM COMPOUNDS
INDIUM PHOSPHIDES
LASERS
LEADING ABSTRACT
LEPTON BEAMS
MATERIALS
MATERIALS TESTING
MEETINGS
MONOCRYSTALS
NIOBIUM COMPOUNDS
NIOBIUM SILICIDES
NONDESTRUCTIVE TESTING
NONMETALS
OXIDES
OXYGEN
OXYGEN COMPOUNDS
PARTICLE BEAMS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
PRECIPITATION
REFRACTORY METAL COMPOUNDS
SEMICONDUCTOR MATERIALS
SEMIMETALS
SEPARATION PROCESSES
SILICIDES
SILICON
SILICON COMPOUNDS
STRUCTURAL CHEMICAL ANALYSIS
TANTALUM COMPOUNDS
TANTALUM SILICIDES
TESTING
TRANSITION ELEMENT COMPOUNDS
TRAPS
ULTRASONIC TESTING
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES
360000* -- Materials
ABSORPTION
ABSTRACTS
ACOUSTIC TESTING
ANNEALING
ARSENIC COMPOUNDS
ARSENIDES
BEAMS
CHALCOGENIDES
CRYSTALS
DOCUMENT TYPES
ELECTRICAL PROPERTIES
ELECTRO-OPTICAL EFFECTS
ELECTRON BEAMS
ELEMENTS
EPITAXY
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
HEAT TREATMENTS
INDIUM COMPOUNDS
INDIUM PHOSPHIDES
LASERS
LEADING ABSTRACT
LEPTON BEAMS
MATERIALS
MATERIALS TESTING
MEETINGS
MONOCRYSTALS
NIOBIUM COMPOUNDS
NIOBIUM SILICIDES
NONDESTRUCTIVE TESTING
NONMETALS
OXIDES
OXYGEN
OXYGEN COMPOUNDS
PARTICLE BEAMS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
PRECIPITATION
REFRACTORY METAL COMPOUNDS
SEMICONDUCTOR MATERIALS
SEMIMETALS
SEPARATION PROCESSES
SILICIDES
SILICON
SILICON COMPOUNDS
STRUCTURAL CHEMICAL ANALYSIS
TANTALUM COMPOUNDS
TANTALUM SILICIDES
TESTING
TRANSITION ELEMENT COMPOUNDS
TRAPS
ULTRASONIC TESTING
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES