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Surface photovoltage at Cs/GaAs(110): Photoemission experiments and theoretical modeling

Conference · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
OSTI ID:7237667
The effects of a surface photovoltage on band bending were investigated with photoemission for interfaces of thin Cs films with p-type GaAs(110) as a function of substrate dopant concentration n and temperature T. Theoretical calculations, which consider recombination by both thermionic emission and tunneling, were found to be in excellent agreement with experimental data. As a result, surface photovoltages are found to contribute only for low dopant concentrations and at low temperatures, with limits depending on the Schottky-barrier height, {Phi}{sub B}: n < 1 {times} 10{sup 18}/cm{sup 3} and T < 280K for {Phi}{sub B} = 0.7 eV, and n < 1.5 {times} 10{sup 18}/cm{sup 3} and T < 390 K for {Phi}{sub B} = 1.0 eV. At high coverages ({Theta} > 2.5 ML), the surface photovoltage is strongly reduced due to edge-leakage currents. Finally, general predictions for the occurrence and magnitude of a surface photovoltage will be given, and recent data will be critically reviewed.
OSTI ID:
7237667
Report Number(s):
CONF-910115--
Conference Information:
Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Journal Volume: 9:4
Country of Publication:
United States
Language:
English