Influence of phantom size, shape, and density, and collimator selection on the dual photopeak window scatter correction method

Journal Article · Tue Feb 01 04:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.281525· OSTI ID:7233823

Hademenos, G J; King, M A ^[1]; Ljungberg, M ^[2]

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1. Univ. of Massachusetts Medical Center, Worcester, MA (United States). Dept. of Nuclear Medicine
2. Lund Univ. (Sweden). Dept. of Radiation Physics

The problem of Compton scatter is a major source of error for SPECT emission imaging. With the scatter compensation techniques which have been introduced in the literature, the effects of phantom variations with size, shape, and density on the scatter correction methods have not been fully investigated. Here, results from a Monte Carlo investigation are presented for the application of the dual photopeak window (DPW) scatter correction method to phantom geometries of varying shapes, sizes, and densities as well as to several collimators. A Monte Carlo program was used to simulate a Tc-99m point source at locations of 0.5 cm from the phantom surface, at the center, 0.5 cm from the bottom, and 4/5 the distance lateral from the center for each case of variation. DPW was then used to correct for scatter using a regression relation determined for a 30.5 cm [times] 23.0 cm water-filled elliptical tub phantom using an ultrahigh resolution collimator. The application of DPW in all cases account for an approximate twelve-fold reduction in scatter fraction with an excellent agreement between the true scatter and scatter estimate distributions both at the tails and under the peak of the point spread functions.

• OSTI ID: 7233823
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 41:1 Pt2; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

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