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U.S. Department of Energy
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High speed imaging for flash radiography using PIN diodes

Conference ·
OSTI ID:7222700
A high speed readout imaging system utilizing a commercial flash X-ray machine and miniature X-ray detectors has been developed. This system was designed to operate in the environment near a nuclear detonation where film or camera imaging cannot be used. The temporal resolution of the system is set by the 20 nanosecond FWHM of the X-ray pulse. The spatial resolution of the system was determined by the size and close packing of the PIN diodes used as the X-ray detectors. In the array used here, the PIN diodes have an active area of 2mm in diameter and were placed 3.8mm center to center. Computer-generated images using algorithms developed for this system are presented and compared with an image captured on film in the laboratory.
Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
DOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
7222700
Report Number(s):
SAND-92-1845C; CONF-9209188--3; ON: DE92040959
Country of Publication:
United States
Language:
English