Development of the EXITE detector: A new imaging detector for 20 - 300 keV astronomy

Conference · Sat Feb 01 04:00:00 EST 1986 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:5892639

Garcia, M R; Grindlay, J E; Burg, R; Murray, S S; Flanagan, J

The authors report on the development and testing of a detector to be used in the Energic X-ray Imaging Telescope Experiment (EXITE). It consists of a 34 cm diameter NaI(T1) crystal coupled directly to a single large image intensifier tube with associated silicon PIN diode readout. The measured spatial and energy resolutions at 122 keV are 6mm (FWHM) and 9% (FWHM), respectively. This energy resolution is approx. =50% better than that of any previously flown hard x-ray experiment. These resolutions decrease with the square root of the energy of the incident x-ray, indicating that they are determined by the number of photons emitted in the NaI(T1) scintillator light flash.

• Research Organization: Harvard/Smithsonian Center for Astrophysics, 60 Garden St., Cambridge, MA 02138
• OSTI ID: 5892639
• Report Number(s): CONF-851009-
• Conference Information: Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: NS-33:1
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ASTRONOMY
DESIGN
DETECTION
ELEMENTARY PARTICLES
ELEMENTS
ENERGY RANGE
ENERGY RESOLUTION
IMAGE INTENSIFIERS
KEV RANGE
KEV RANGE 10-100
KEV RANGE 100-1000
MASSLESS PARTICLES
MEASURING INSTRUMENTS
NAI DETECTORS
PERFORMANCE TESTING
PHOTONS
RADIATION DETECTION
RADIATION DETECTORS
READOUT SYSTEMS
RESEARCH PROGRAMS
RESOLUTION
SCINTILLATION COUNTERS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
SILICON
SOLID SCINTILLATION DETECTORS
SPATIAL RESOLUTION
TELESCOPES
TESTING
X-RAY DETECTION