Atomic imaging by x-ray-fluorescence holography and electron-emission holography: A comparative theoretical study

Journal Article · Sat Oct 15 00:00:00 EDT 1994 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.50.11275· OSTI ID:7183739

Len, P M; Thevuthasan, S; Fadley, C S ^[1]; Kaduwela, A P; Van Hove, M A ^[2]

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1. Department of Physics, University of California at Davis, Davis, California 95616 (United States)
2. Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)

We consider from a theoretical viewpoint the direct imaging of atoms at and near the surfaces of solids by both x-ray-fluorescence holography (XFH) and electron-emission holography (EEH). The more ideal nature of x-ray scattering makes XFH images superior to those in single-energy EEH. The overlap of real and twin features for pairs of atoms at [plus minus]a can cause their XFH or EEH atomic images to cancel for certain combinations of wave vector and [vert bar]a[vert bar]. The relative merits of XFH and EEH for structure studies are considered.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 7183739
• Journal Information: Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 50:15; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
ATOMIC CLUSTERS
CHEMICAL ANALYSIS
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTS
HOLOGRAPHY
LATTICE PARAMETERS
METALS
MOLYBDENUM
NONDESTRUCTIVE ANALYSIS
PHOTOELECTRON SPECTROSCOPY
SCATTERING
SPECTROSCOPY
SURFACE PROPERTIES
TRANSITION ELEMENTS
X-RAY DIFFRACTION
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS