Inverse Fourier analysis in x-ray fluorescence holography
- Institute for Materials Research, Tohoku University, Aoba-ku, Sendai 980-8577 (Japan)
X-ray fluorescence holography (XFH) is a promising tool for determing the local structures around specified elements. To obtain accurate interatomic distances, we applied inverse Fourier analysis, which has often been used to investigate extended x-ray absorption fine structures, to multiple energy x-ray holograms. The interatomic distances of neighboring atoms around a fluorescing atom were estimated from the 16 experimental holograms of a Au single crystal and most of them were in good agreement with the actual values within an error of 0.3%. The use of inverse Fourier analysis improves the XFH for the evaluation of quantitative local lattice distortion around impurities in single crystals.
- OSTI ID:
- 20719043
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Journal Name: Physical Review. B, Condensed Matter and Materials Physics Journal Issue: 22 Vol. 71; ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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