Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Optical materials characterization. Semiannual technical report, 1 Jan 1975--31 Jul 1975

Technical Report ·
OSTI ID:7182284
The refractive index of each of two prismatic samples of chemical vapor deposited (CVD) ZnSe was measured from 0.5086 ..mu..m to 18.2 ..mu..m by means of the minimum-deviation method on a precision spectrometer. Data were obtained at temperatures near 20 and 34/sup 0/C and each set of data was fitted to a three-term Sellmeier-type dispersion equation, which permits refractive index interpolation within several parts in 10/sup -5/. From the data obtained at the two temperatures, dn/dT was calculated for both samples. A comparison of refractive index and dn/dT is made with other types of ZnSe. Preliminary photoelastic data are presented for single crystal specimens of Ge, reactive atmosphere processed (RAP) KCl, and KCl doped with KI. The Ge data, which was obtained at 10.6 ..mu..m differ from previously reported data. Data on the two types of KCl were obtained at 10.6 ..mu..m, 0.633 ..mu..m and 0.644 ..mu..m. These data are compared with values from the literature. Also presented are revised photoelasticity data for CVD ZnSe. The design of an improved stressing apparatus that was developed for the measurement of photoelastic constants is discussed.
Research Organization:
National Bureau of Standards, Washington, D.C. (USA)
OSTI ID:
7182284
Report Number(s):
COM-75-11375; NBSIR-75-781
Country of Publication:
United States
Language:
English