Optical materials characterization. Semiannual technical report, 1 Jul-31 Dec 1974
Technical Report
·
OSTI ID:4047092
The authors have measured the following parameters of chemical vapor deposited polycrystalline ZnSe (CVD ZnSe): refractive index and change of index of refraction with temperature (dn/dT) over the wavelength range 0.5 micrometers to 18 micrometers using the method of minimum deviation; the coefficient of linear thermal expansion and dn/dT at 10.6 $mu$m using Fizeau interferometry; and the elastic moduli and photoelastic moduli using Fizeau and Twyman-Green interferometry. A sensitive technique has been developed for measuring stress- optical constants of materials that exhibit a small stress-optical effect. (GRA)
- Research Organization:
- National Bureau of Standards, Boulder, Colo. (USA). Inst. for Basic Standards
- NSA Number:
- NSA-33-028848
- OSTI ID:
- 4047092
- Report Number(s):
- COM--75-10135; NBSIR--75-639
- Country of Publication:
- United States
- Language:
- English
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