Influence of ion implantation and the adsorption of molecular oxygen on the composition of surface layers and the work function of molybdenum and tungsten
The authors used x-ray photoelectron spectroscopy (XPS) to investigate the influence of ion implantation and the adsorption of molecular oxygen at 300/sup 0/K on the composition of surface layers (with thicknesses up to 3 nm) of Mo(110) and W(110). The changes in the work function ..delta.. phi occurring as a result of these processes were determined by finding the threshold for the emission of secondary electrons upon their excitation by x radiation. All the experiments, which included the cleaning of the surfaces by Ar/sup +/ ions, the ion implantation of O/sub 2//sup +/, the adsorption of O/sub 2/, the analysis of the composition of the surface layers by XPS, and the determination of ..delta.. phi were carried out in situ in the ultrahigh-vacuum changer of a Leybold-Heraeus LHS-10 electron spectrometer.
- Research Organization:
- M. V. Lomonosov Moscow Institute of Fine Chemical Engineering (USSR)
- OSTI ID:
- 7173235
- Journal Information:
- Dokl. Phys. Chem. (Engl. Transl.); (United States), Journal Name: Dokl. Phys. Chem. (Engl. Transl.); (United States) Vol. 294:1-3; ISSN DKPCA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360102* -- Metals & Alloys-- Structure & Phase Studies
360104 -- Metals & Alloys-- Physical Properties
ADSORPTION
ARGON IONS
AUGER ELECTRON SPECTROSCOPY
BEAMS
CHARGED PARTICLES
CHEMICAL COMPOSITION
CLEANING
ELECTRON EMISSION
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
FUNCTIONS
ION BEAMS
ION IMPLANTATION
IONS
MATERIALS
METALLURGICAL EFFECTS
METALS
MOLECULAR IONS
MOLYBDENUM
NONMETALS
OXYGEN
OXYGEN IONS
PHOTOELECTRON SPECTROSCOPY
SECONDARY EMISSION
SORPTION
SPECTRA
SPECTROSCOPY
SURFACE CLEANING
SURFACE FINISHING
THERMOELECTRIC MATERIALS
TRANSITION ELEMENTS
TUNGSTEN
WORK FUNCTIONS
X-RAY SPECTRA