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Characteristics of high performance YBa sub 2 Cu sub 3 O sub 7 step-edge junctions

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.107690· OSTI ID:7172811
; ; ; ; ; ;  [1];  [2]
  1. TRW Space and Technology Group, One Space Park, Redondo Beach, California 90278 (United States)
  2. Material Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Step-edge Josephson junctions are engineered grain boundary junctions fabricated using standard lithographic and film deposition techniques. We report a systematic study of 180 YBa{sub 2}Cu{sub 3}O{sub 7} step-edge junctions and identify a fabrication technique which results in a 90% yield of working junctions with critical current spreads from 30% to 50% (1{sigma}/{ital I}{sub {ital c}-ave})over the entire substrate. Technically useful critical current values at 65 K can be obtained by adjusting YBa{sub 2}Cu{sub 3}O{sub 7} film thickness. {ital I}{sub {ital c}R{ital n}} values, approximately independent of film thickness, are {similar to}1 mV at 4.2 K and {similar to}0.1 mV at 65 K. Most junctions exhibit ideal electrical behavior in accordance with the RSJ model.
OSTI ID:
7172811
Journal Information:
Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 61:9; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English