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Transient intensity noise of semiconductor lasers; Experiments and comparison with theory

Journal Article · · IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (USA)
DOI:https://doi.org/10.1109/3.44953· OSTI ID:7169134
An experimental setup for the measurement of the non-stationary intensity fluctuations during the turn-on transient of semi-conductor lasers is presented. Measurements are carried out and compared with simulations, which are based on rate equations with Langevin fluctuation functions. Agreement between theory and measurements is found and is confirmed that the nonstationary intensity noise can be interpreted as timing jitter.
OSTI ID:
7169134
Journal Information:
IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (USA) Vol. 26:2; ISSN 0018-9197; ISSN IEJQA
Country of Publication:
United States
Language:
English

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