Formation and characterization of grain-oriented VO sub 2 thin films

Journal Article · Thu Dec 14 23:00:00 EST 1989 · Journal of Applied Physics; (USA)

DOI:https://doi.org/10.1063/1.343605· OSTI ID:7167923

De Natale, J F; Hood, P J; Harker, A B ^[1]

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1. Rockwell International Science Center, Thousand Oaks, California 91360 (US)

Grain-oriented films of VO{sub 2} have been prepared to characterize the effects of film orientation on electrical and optical switching performance. This oriented growth has been achieved by lattice matching to (0001) sapphire, and results in intergranular structures favorable to rapid propagation of the monoclinic-tetragonal phase transformation. The electrical and optical property changes across this transition are strongly affected by film microstructure, with the oriented structures favoring rapid switching and narrow hysteresis.

• OSTI ID: 7167923
• Journal Information: Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 66:12; ISSN 0021-8979; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
BEAMS
CHALCOGENIDES
COATINGS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTAL-PHASE TRANSFORMATIONS
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTRON BEAMS
EQUIPMENT
FILMS
GRAIN ORIENTATION
HYSTERESIS
ION BEAMS
LEPTON BEAMS
MICROSTRUCTURE
MONOCLINIC LATTICES
OPTICAL PROPERTIES
ORIENTATION
OXIDES
OXYGEN COMPOUNDS
PARTICLE BEAMS
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
SPUTTERING
SWITCHES
SYNTHESIS
TETRAGONAL LATTICES
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
ULTRAHIGH VACUUM
VANADIUM COMPOUNDS
VANADIUM OXIDES
VAPOR DEPOSITED COATINGS