Abundance and depth of origin of neutral and ionic clusters sputtered from a liquid gallium-indium eutectic alloy

Journal Article · Mon Sep 19 00:00:00 EDT 1994 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.73.1719· OSTI ID:7167445

Lill, T B; Callaway, W F; Pellin, M J; Gruen, D M ^[1]

---

1. Materials Science, Chemical Technology, and Chemistry Divisions, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Neutral and positively charged clusters produced by 4 keV Ar[sup +] ion bombardment of a liquid gallium-indium eutectic alloy have been studied by time-of-flight mass spectrometry coupled with single photon positionization of the neutrals. The abundence distributions for clusters with equal nuclearity are statistical. They confirm a strong indium surface segregation. An increasing gallium content and therefore larger depth of origin, was found for increasing cluster size.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 7167445
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 73:12; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

665300* -- Interactions Between Beams & Condensed Matter-- (1992-)
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700350 -- Plasma Production
Heating
Current Drive
& Interactions-- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALLOY SYSTEMS
ALLOYS
ARGON IONS
ATOMIC CLUSTERS
BEAMS
BINARY ALLOY SYSTEMS
CHARGE STATES
CHARGED PARTICLES
ENERGY RANGE
FLUIDS
GALLIUM ALLOYS
INDIUM ALLOYS
ION BEAMS
IONS
KEV RANGE
KEV RANGE 01-10
LIQUIDS
MASS SPECTRA
SPECTRA
SPUTTERING
TIME-OF-FLIGHT METHOD