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Structures and electronic properties of misfit dislocations in ZnSe/GaAs(001) heterojunctions

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.112293· OSTI ID:7166603
; ; ; ; ; ;  [1]; ; ; ;  [2]
  1. Materials Science Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720 (United States)
  2. Philips Laboratories, Briarcliff Manor, New York 10510 (United States)

The structures and electronic properties of misfit dislocations in ZnSe/GaAs(001) heterojunctions have been studied by transmission electron microscopy, cathodoluminescence (CL), and photoluminescence. In undoped ZnSe epilayers, irregular dislocation segments tending to lie roughly along [100] and [010] directions were observed as well as long straight 60[degree] dislocations along [110] and [1[bar 1]0] directions. In N-doped ([N][gt]1[times]10[sup 18] cm[sup [minus]3]) ZnSe epilayers, the misfit dislocations were predominantly dissociated into partial dislocations which makes cross slip and formation of irregular dislocations more difficult; only the straight dislocations along [110] and [1[bar 1]0] were observed. The CL observations suggest that the irregular dislocations trap carriers more efficiently than the dislocations along [l angle]110[r angle].

DOE Contract Number:
AC03-76SF00098
OSTI ID:
7166603
Journal Information:
Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 65:5; ISSN 0003-6951; ISSN APPLAB
Country of Publication:
United States
Language:
English