Holographic inspection of plates containing areas of localized thickness variation

Journal Article · Fri Apr 01 04:00:00 EST 1994 · Journal of Engineering Materials and Technology; (United States)

DOI:https://doi.org/10.1115/1.2904267· OSTI ID:7163931

Shang, H M; Lwin, M; Tay, T E ^[1]

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1. National Univ. of Singapore, Kent Ridge (Singapore)

Circular plates, under unknown clamping conditions and containing simulated defects in the form of circular localized thinning or thickening, are inspected by double-exposure holography. With an incremental uniform pressure applied between exposures, eccentric defects are readily revealed from the distinct irregular fringe patterns. In the case of central circular defects, however, the absence of distinct irregular fringe patterns does not enable easy visual detection of the defects. The simple method of analysis described in this paper, based on the fact that the displacement in a defective plate differs from that in a defect-free plate, alloys easy deduction of central and eccentric defects from the fringe patterns. Furthermore, this method enables identification of the type of defect (localized thinning or thickening), the extent of thickness variation, as well as an accurate estimation of the location and size of the defect.

• OSTI ID: 7163931
• Journal Information: Journal of Engineering Materials and Technology; (United States), Journal Name: Journal of Engineering Materials and Technology; (United States) Vol. 116:2; ISSN 0094-4289; ISSN JEMTA8
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420500* -- Engineering-- Materials Testing
DATA
DEFECTS
DIMENSIONS
EXPERIMENTAL DATA
HOLOGRAPHY
INFORMATION
MATERIALS TESTING
NONDESTRUCTIVE TESTING
NUMERICAL DATA
PLATES
TESTING
THICKNESS