X-ray attenuation measurements for high-temperature materials characterization and in-situ monitoring of damage accumulation

Thesis/Dissertation · Mon Dec 31 23:00:00 EST 1990

OSTI ID:7162528

Baaklini, G Y

The scope of this study was to develop and apply x-ray attenuation measurement systems that are capable of (1) characterizing density variations in high-temperature materials, e.g., monolithic ceramics and ceramic and intermetallic-matrix composites, and (2) noninvasively monitoring damage accumulation and failure sequences in ceramic-matrix composites under room-temperature tensile testing. This thesis resulted in the development of (1) a point-scan digital radiography system and (2) an in-situ x-ray material testing system. The former is used to characterize silicon carbide and silicon nitride specimens, and the latter is used to image the failure behavior of silicon carbide fiber reinforced reaction bonded silicon nitride matrix composites. Further, state of the art x-ray computed tomography is investigated to determine its capabilities and limitations in characterizing density variations of subscale engine components. Microfocus radiography, conventional radiography, scanning acoustic microscopy, and metallography are used to substantiate the x-ray computed tomography findings.

• Research Organization: Cleveland State Univ., OH (United States)
• OSTI ID: 7162528
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
360602 -- Other Materials-- Structure & Phase Studies
360606 -- Other Materials-- Physical Properties-- (1992-)
42 ENGINEERING
420500* -- Engineering-- Materials Testing
ACOUSTIC MICROSCOPY
ALLOYS
CARBIDES
CARBON COMPOUNDS
CERAMICS
COMPOSITE MATERIALS
COMPUTERIZED TOMOGRAPHY
DAMAGE
DENSITY
DIAGNOSTIC TECHNIQUES
FAILURES
FIBERS
INDUSTRIAL RADIOGRAPHY
INTERMETALLIC COMPOUNDS
MATERIALS
MATERIALS TESTING
MATRIX MATERIALS
METALLOGRAPHY
MICROSCOPY
NITRIDES
NITROGEN COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
REINFORCED MATERIALS
SILICON CARBIDES
SILICON COMPOUNDS
SILICON NITRIDES
TESTING
TOMOGRAPHY
X-RAY RADIOGRAPHY