Factors that affect reliability of nondestructive detection of flaws in structural ceramics

Conference · Tue Dec 31 23:00:00 EST 1985

OSTI ID:6961255

Klima, S J; Baaklini, G Y; Roth, D J

The factors that affect reliability of nondestructive detection of flaws in structural ceramics by microfocus radiography and scanning laser acoustic microscopy (SLAM) were investigated. Reliability of void detection in silicon nitride and silicon carbide by microfocus X-rays was affected by photon energy level, material chemistry in the immediate vicinity of the void, and the presence of loose powder aggregates inside the void cavity. The sensitivity of SLAM to voids was affected by material microstructure, the level of porosity, and the condition of the specimen surfaces. Statistical results are presented in the form of probability of detection as a function of void diameter for green compacts and sintered materials.

• Research Organization: National Aeronautics and Space Administration, Cleveland, OH (USA). Lewis Research Center
• OSTI ID: 6961255
• Report Number(s): N-86-31912; NASA-TM-87348; E-3096; NAS-1.15:87348; CONF-860413-4
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
42 ENGINEERING
420500* -- Engineering-- Materials Testing
ACOUSTIC MICROSCOPY
CARBIDES
CARBON COMPOUNDS
CERAMICS
CRYSTAL STRUCTURE
MATERIALS TESTING
MICRORADIOGRAPHY
MICROSCOPY
MICROSTRUCTURE
NITRIDES
NITROGEN COMPOUNDS
NONDESTRUCTIVE TESTING
PNICTIDES
POROSITY
SILICON CARBIDES
SILICON COMPOUNDS
SILICON NITRIDES
TESTING
VOIDS