Reliability of scanning laser acoustic microscopy for detecting internal voids in structural ceramics

Conference · Tue Dec 31 23:00:00 EST 1985

OSTI ID:5907897

Roth, D J; Baaklini, G Y

The reliability of 100 MHz scanning laser acoustic microscopy (SLAM) for detecting internal voids in sintered specimens of silicon nitride and silicon carbide was evaluated. The specimens contained artificially implanted voids and were positioned at depths ranging up to 2 mm below the specimen surface. Detection probability of 0.90 at a 0.95 confidence level was determined as a function of material, void diameter, and void depth. The statistical results presented for void detectability indicate some of the strengths and limitations of SLAM as a nondestructive evaluation technique for structural ceramics.

• Research Organization: National Aeronautics and Space Administration, Cleveland, OH (USA). Lewis Research Center
• OSTI ID: 5907897
• Report Number(s): N-86-16599; NASA-TM-87222; E-2864; CONF-860152-3
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
CARBIDES
CARBON COMPOUNDS
DATA
DETECTION
ELECTROMAGNETIC RADIATION
EXPERIMENTAL DATA
FABRICATION
INFORMATION
LASER RADIATION
MICROSCOPY
NITRIDES
NITROGEN COMPOUNDS
NUMERICAL DATA
PNICTIDES
RADIATIONS
RELIABILITY
SCANNING LIGHT MICROSCOPY
SILICON CARBIDES
SILICON COMPOUNDS
SILICON NITRIDES
SINTERING
VOIDS