Quantitative void characterization in structural ceramics using scanning laser acoustic microscopy

Conference · Tue Dec 31 23:00:00 EST 1985

OSTI ID:6909958

Roth, D J; Generazio, E R; Baaklini, G Y

The ability of scanning laser acoustic microscopy (SLAM) to characterize artificially seeded voids in sintered silicon nitride structural ceramic specimens was investigated. Using trigonometric relationships and Airy's diffraction theory, predictions of internal void depth and size were obtained from acoustic diffraction patterns produced by the voids. Agreement was observed between actual and predicted void depths. However, predicted void diameters were generally much greater than actual diameters. Precise diameter predictions are difficult to obtain due to measurement uncertainty and the limitations of 100 MHz SLAM applied to typical ceramic specimens.

• Research Organization: National Aeronautics and Space Administration, Cleveland, OH (USA). Lewis Research Center
• OSTI ID: 6909958
• Report Number(s): N-86-31913; NASA-TM-88797; E-3166; NAS-1.15:88797; CONF-861107-1
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
ACOUSTIC MICROSCOPY
CERAMICS
COHERENT SCATTERING
DIFFRACTION
MATERIALS TESTING
MICROSCOPY
NITRIDES
NITROGEN COMPOUNDS
NONDESTRUCTIVE TESTING
PNICTIDES
SCATTERING
SILICON COMPOUNDS
SILICON NITRIDES
TESTING
VOIDS