Applied spectroscopy in materials science II; Proceedings of the Meeting, Los Angeles, CA, Jan. 20-22, 1992

Conference · Wed Jan 01 04:00:00 EST 1992

OSTI ID:7162194

Golden, W G ^[1]

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1. IBM Almaden Research Center, San Jose, CA (United States)

Various papers on applied spectroscopy in materials science are presented. Individual topics addressed include: ultrasensitive detection of trace gases with diode lasers by frequency modulation spectroscopy, laser diode spectroscopy as a probe of ammonium ion dynamics in crystals, molecular view of polymer viscoelasticity using IR polarimetry, tunable diode IRRAS study of CO on Pt(111), laser chemistry relevant to III-V semiconductor growth, multiresonant nonlinear spectroscopy, picosecond photoluminescence of hydrogenated amorphous carbon and of a-Si:H/a-SiN(x):H multilayers. Also discussed are: transient coherent multiphoton scattering in crystal LiB3O5, surface Raman scattering of organic thin films on transition metal surfaces, vibrational spectroscopy in high-temperature dense fluids, new chemical measurements with nonlinear spectroscopy, LIF measurement of CH* radical state through chemical sputtering, structures and stabilities of carbon cluster ions, systematics of isotope ratio measurements with resonant laser photoionization sources.

• OSTI ID: 7162194
• Report Number(s): CONF-920124--; ISBN: 0-8194-0782-8
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
CHEMISTRY
DESORPTION
ELECTROCHEMISTRY
FILMS
FREQUENCY MIXING
HARMONIC GENERATION
LASER SPECTROSCOPY
LASERS
LUMINESCENCE
MASS SPECTROSCOPY
MATERIALS
MEETINGS
RAMAN SPECTROSCOPY
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
SORPTION
SPECTROSCOPY
SURFACE PROPERTIES
THIN FILMS