Amorphous Ge bipolar blocking contacts on Ge detectors

Conference · Sat Aug 01 00:00:00 EDT 1992 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:7139696

Luke, P N; Cork, C P; Madden, N W; Rossington, C S; Wesela, M F ^[1]

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1. Lawrence Berkeley Lab., CA (United States)

This paper reports on electrical contacts formed using sputtered amorphous Ge (a-Ge) films on high-purity Ge crystals, both n- and p-type, were found to exhibit good blocking behavior with low leakage currents, with the contact biased under either voltage polarity. The a-Ge contacts have thin dead layers associated with them and can be used in place of lithium-diffused, ion-implanted or Schottky barrier contacts on Ge radiation detectors. The use of such contacts allows fabrication of multielectrode detectors by means of simple processing steps.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 7139696
• Report Number(s): CONF-911106-; CODEN: IETNAE
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 39:4; Conference: 1991 Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Santa Fe, NM (United States), 2-9 Nov 1991; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ELECTRIC CONTACTS
FABRICATION
GERMANIUM
THIN FILMS
HIGH-PURITY GE DETECTORS
SPUTTERING
AMORPHOUS STATE
LEAKAGE CURRENT
N-TYPE CONDUCTORS
P-TYPE CONDUCTORS
SCHOTTKY BARRIER DIODES
CURRENTS
ELECTRIC CURRENTS
ELECTRICAL EQUIPMENT
ELEMENTS
EQUIPMENT
FILMS
GE SEMICONDUCTOR DETECTORS
MATERIALS
MEASURING INSTRUMENTS
METALS
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMICONDUCTOR MATERIALS
360601* - Other Materials- Preparation & Manufacture
665300 - Interactions Between Beams & Condensed Matter- (1992-)
360606 - Other Materials- Physical Properties- (1992-)