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Low degradation rate in strained InGaAs/AlGaAs single quantum well lasers

Journal Article · · IEEE Photonics Technology Letters (Institute of Electrical and Electronics Engineers); (USA)
DOI:https://doi.org/10.1109/68.50880· OSTI ID:7139574
; ; ; ;  [1]
  1. David Sarnoff Research Center, Princeton, NJ (USA)
This paper reports a 10,000 h, 30{degrees}C constant-current lifetest performed on five strained In{sub 0.2}Ga{sub 0.8}As/AlGaAs single quantum well lasers, with {lambda} {approximately} 930 nm. The devices are 90 {mu}m {times} 400 {mu}m oxide-stripe lasers with facet coatings, grown by atmospheric pressure organometallic vapor phase epitaxy. For each diode, the current was maintained at a constant value of {approximately} 300 mA, corresponding to approximately 100 mW output power. After 10{sup 4} h, thresholds increased from an average of 84 mA, while quantum efficiencies were essentially unchanged. In relation to a typical 100 mW constant-power lifetest, this is equivalent to a degradation rate less than 1% per kh.
OSTI ID:
7139574
Journal Information:
IEEE Photonics Technology Letters (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Photonics Technology Letters (Institute of Electrical and Electronics Engineers); (USA) Vol. 2:3; ISSN IPTLE; ISSN 1041-1135
Country of Publication:
United States
Language:
English