Control for monitoring thickness of high temperature refractory
Patent
·
OSTI ID:7137312
This invention teaches an improved monitoring device for detecting the changes in thickness of high-temperature refractory, the device consists of a probe having at least two electrically conductive generally parallel elements separated by a dielectric material. The probe is implanted or embedded directly in the refractory and is elongated to extend in line with the refractory thickness to be measured. Electrical inputs to the conductive elements provide that either or both the electrical conductance or capacitance can be found, so that charges over lapsed time periods can be compared in order to detect changes in the thickness of the refractory.
- DOE Contract Number:
- W-31-109-ENG-38
- Assignee:
- Dept. of Energy
- Application Number:
- ON: DE84005938
- OSTI ID:
- 7137312
- Country of Publication:
- United States
- Language:
- English
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