X-ray response of silicon surface-barrier diodes at 8 and 17. 5 keV: Evidence that the x-ray sensitive depth is not generally the depletion depth

Journal Article · Mon Aug 01 04:00:00 EDT 1988 · Rev. Sci. Instrum.; (United States)

DOI:https://doi.org/10.1063/1.1139673· OSTI ID:7126669

Wenzel, K W; Petrasso, R D

The absolute x-ray response of 18 EGandG Ortec partially depleted silicon surface-barrier diodes (SBDs) has been measured at 8 and 17.5 keV. In addition we have examined the x-ray response of four Tennelec and two United Detector Technology partially depleted SBDs. The variation in response to 8 keV x rays, for which the optical depth is about 5, is comparatively slight (approx. <12%). The variation in response to 17.5-keV x rays, for which the optical depth is only approx.0.7, is comparatively large (approx.100%). These variations are mainly attributable to differences in the SBD physical thicknesses, and thus to differences in optical depth. At both 8 and 17.5 keV the diodes respond linearly to large variations in incident flux (over three orders of magnitude). This linearity, and the diode x-ray response, in general, is insensitive to large changes in the detector bias voltage; thus the depletion depth, proportional to the square root of the bias voltage, does not play a critical role in determining the x-ray sensitive depth.

• Research Organization: MIT Plasma Fusion Center, Cambridge, Massachusetts 02139
• OSTI ID: 7126669
• Journal Information: Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 59:8; ISSN RSINA
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
CALIBRATION
DETECTION
EQUIPMENT
FUNCTIONS
MEASURING INSTRUMENTS
PERFORMANCE
PLASMA DIAGNOSTICS
RADIATION DETECTION
RADIATION DETECTORS
RADIATION SOURCES
RESPONSE FUNCTIONS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SILICON DIODES
SURFACE BARRIER DETECTORS
X-RAY DETECTION
X-RAY EQUIPMENT
X-RAY SOURCES