XUV spectral observations with two-wavelength laser irradiation
Journal Article
·
· Rev. Sci. Instrum.; (United States)
XUV diagnostic equipment was designed and utilized on the OMEGA target chamber at the University of Rochester to study high atomic number plasma generation by two-wavelength laser excitation. Spectral data were collected from silver tracer dot targets irradiated with 1/3 TW of 0.35-..mu..m laser light of the multiple-beam OMEGA laser and the single synchronized 1.06-..mu..m beam of the GDL laser for generating energetic electrons. XUV spectral data in the 30--300-A region were obtained with both a 3-m grazing incidence spectrograph and a compact 1-m grazing incidence spectrograph designed for reentrant mounting in the OMEGA chamber. High-resolution x-ray spectra were acquired in the 3.6--4.2-A region with a dual, flat-diffraction crystal spectrograph. A low-resolution x-ray spectrum of silver was recorded with a curved mica spectrograph. Some x-ray spectral lines appeared only when both OMEGA and GDL beams were used. These were identified as 2p--3s,3d transitions in F-like Ag XXXIX. F-, Na-, and Mg-like lines were found in the grazing incidence spectra, with F-like lines appearing only with 1.06-..mu..m irradiation.
- Research Organization:
- Naval Research Laboratory, Washington, DC 20375-5000
- OSTI ID:
- 7123497
- Journal Information:
- Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 59:8; ISSN RSINA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
700208 -- Fusion Power Plant Technology-- Inertial Confinement Technology
ATOMIC IONS
CHARGED PARTICLES
EXTREME ULTRAVIOLET SPECTRA
IONS
LASER-PRODUCED PLASMA
MEASURING INSTRUMENTS
OMEGA FACILITY
PLASMA
PLASMA DIAGNOSTICS
SPECTRA
SPECTROMETERS
ULTRAVIOLET SPECTROMETERS
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
700208 -- Fusion Power Plant Technology-- Inertial Confinement Technology
ATOMIC IONS
CHARGED PARTICLES
EXTREME ULTRAVIOLET SPECTRA
IONS
LASER-PRODUCED PLASMA
MEASURING INSTRUMENTS
OMEGA FACILITY
PLASMA
PLASMA DIAGNOSTICS
SPECTRA
SPECTROMETERS
ULTRAVIOLET SPECTROMETERS