Superconducting Tl-Ca-Ba-Cu-O thin films by reactive magnetron sputtering
- Brookhaven National Laboratory, Upton, NY 11973 (USA)
Superconducting Tl-Ca-Ba-Cu-O thin films with T{sub c} onsets of 115 K and T{sub c} (R=0) of 95 K have been prepared by reactive magnetron sputtering using Tl, Cu and Ca/Ba metal targets. It was found that proper thallium content a is crucial for obtaining a high transition temperature. Wet oxygen and sealed gold tube with additional thallium compounds were used to reduce the loss of thallium during annealing. X-ray diffraction spectra show that films with the sharpest transition at 95 K are predominantly c-axis oriented. XANES also shows a preferred c-axis orientation for the superconducting films while for a nonsuperconducting film the near edge structure suggests greater disorder. X-ray microprobe fluorescence measurements indicate that these films are close to the 2122 stoichiometry. Scanning electron microscopy on these films is also presented.
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 7123054
- Report Number(s):
- CONF-881035--
- Journal Information:
- AIP Conference Proceedings (American Institute of Physics); (USA), Journal Name: AIP Conference Proceedings (American Institute of Physics); (USA) Vol. 182:1; ISSN APCPC; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360201* -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
ALKALINE EARTH METAL COMPOUNDS
ANNEALING
BARIUM COMPOUNDS
BARIUM OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CHALCOGENIDES
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
FABRICATION
FILMS
HEAT TREATMENTS
MICROSCOPY
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SCATTERING
SPUTTERING
STOICHIOMETRY
SUPERCONDUCTIVITY
THALLIUM COMPOUNDS
THALLIUM OXIDES
THERMODYNAMIC PROPERTIES
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TRANSITION TEMPERATURE
X-RAY DIFFRACTION
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES