A direct comparison of Ge and Si(Li) detectors in the 2-20 keV range
Conference
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:7122620
- Lawrence Berkeley Lab., CA (United States)
The spectral response of high purity Ge (HPGe) and lithium-drifted Si (Si(Li)) surface barrier detectors of similar geometry has been measured over a range of x-ray energies under identical experimental conditions. In this paper detector characteristics such as spectral background, escape peak intensity, entrance window absorption, and energy resolution are presented and compared. Although these characteristics have been discussed in the literature previously, this paper represents an attempt to consolidate the information by making comparisons under equivalent experimental conditions for the two types of detectors. A primary goal of the study is a comparison of the two types of detectors for use in x-ray fluorescence applications.
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 7122620
- Report Number(s):
- CONF-911106--
- Conference Information:
- Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 39:4
- Country of Publication:
- United States
- Language:
- English
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A direct comparison of Ge and Si(Li) detectors in the 2--20 keV range
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A direct comparison of Ge and Si(Li) detectors in the 2--20 keV range
Conference
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Journal Article
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Sun Mar 31 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5045208
Related Subjects
36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
440100 -- Radiation Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
664200 -- Spectra of Atoms & Molecules & their Interactions with Photons-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
CHEMICAL ANALYSIS
DATA
ELEMENTS
EXPERIMENTAL DATA
GE SEMICONDUCTOR DETECTORS
GERMANIUM
HIGH-PURITY GE DETECTORS
INFORMATION
LI-DRIFTED DETECTORS
LI-DRIFTED SI DETECTORS
MEASURING INSTRUMENTS
METALS
NONDESTRUCTIVE ANALYSIS
NUMERICAL DATA
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SI SEMICONDUCTOR DETECTORS
SPECTRA
SPECTRAL RESPONSE
SURFACE BARRIER DETECTORS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTRA
360606* -- Other Materials-- Physical Properties-- (1992-)
440100 -- Radiation Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
664200 -- Spectra of Atoms & Molecules & their Interactions with Photons-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
CHEMICAL ANALYSIS
DATA
ELEMENTS
EXPERIMENTAL DATA
GE SEMICONDUCTOR DETECTORS
GERMANIUM
HIGH-PURITY GE DETECTORS
INFORMATION
LI-DRIFTED DETECTORS
LI-DRIFTED SI DETECTORS
MEASURING INSTRUMENTS
METALS
NONDESTRUCTIVE ANALYSIS
NUMERICAL DATA
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SI SEMICONDUCTOR DETECTORS
SPECTRA
SPECTRAL RESPONSE
SURFACE BARRIER DETECTORS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTRA