A direct comparison of Ge and Si(Li) detectors in the 2--20 keV range
Conference
·
OSTI ID:5887221
The spectral response of high purity Ge (HPGe) and lithium-drifted Si (Si(Li)) surface barrier detectors of similar geometry has been measured over a range of x-ray energies under identical experimental conditions. Detector characteristics such as spectral background, escape peak intensity, entrance window absorption, and energy resolution are presented and compared. Although these characteristic have been discussed in the literature previously, this paper represents an attempt to consolidate the information by making comparisons under equivalent experimental conditions for the two types of detectors. A primary goal of the study is a comparison of the two types of detectors for use in x-ray fluorescence applications.
- Research Organization:
- Lawrence Berkeley Lab., CA (United States)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5887221
- Report Number(s):
- LBL-30614; CONF-911106--43; ON: DE92004170
- Country of Publication:
- United States
- Language:
- English
Similar Records
A direct comparison of Ge and Si(Li) detectors in the 2--20 keV range
A direct comparison of Ge and Si(Li) detectors in the 2-20 keV range
Si(Li) detectors with thin dead layers for low energy x-ray detection
Conference
·
Tue Oct 01 00:00:00 EDT 1991
·
OSTI ID:10107938
A direct comparison of Ge and Si(Li) detectors in the 2-20 keV range
Conference
·
Sat Aug 01 00:00:00 EDT 1992
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:7122620
Si(Li) detectors with thin dead layers for low energy x-ray detection
Journal Article
·
Sun Mar 31 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5045208
Related Subjects
440100* -- Radiation Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION
DETECTION
GAMMA DETECTION
GE SEMICONDUCTOR DETECTORS
K ABSORPTION
LI-DRIFTED DETECTORS
LI-DRIFTED SI DETECTORS
MEASURING INSTRUMENTS
OPENINGS
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SENSITIVITY
SI SEMICONDUCTOR DETECTORS
SPECTRAL RESPONSE
SURFACE BARRIER DETECTORS
WINDOWS
X-RAY DETECTION
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION
DETECTION
GAMMA DETECTION
GE SEMICONDUCTOR DETECTORS
K ABSORPTION
LI-DRIFTED DETECTORS
LI-DRIFTED SI DETECTORS
MEASURING INSTRUMENTS
OPENINGS
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SENSITIVITY
SI SEMICONDUCTOR DETECTORS
SPECTRAL RESPONSE
SURFACE BARRIER DETECTORS
WINDOWS
X-RAY DETECTION