Photon scanning tunneling microscope study of optical waveguides

Journal Article · Mon Apr 16 00:00:00 EDT 1990 · Applied Physics Letters; (USA)

DOI:https://doi.org/10.1063/1.103160· OSTI ID:7120135

Tsai, D P; Jackson, H E ^[1]; Reddick, R C; Sharp, S H; Warmack, R J ^[2]

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1. Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221 (USA)
2. Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (USA) Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37919 (USA)

A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.

• DOE Contract Number: AC05-84OR21400
• OSTI ID: 7120135
• Journal Information: Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 56:16; ISSN APPLA; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

440600* -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ELEMENTARY PARTICLES
MASSLESS PARTICLES
MICROSCOPES
MICROSCOPY
OPTICAL MICROSCOPES
OPTICAL MICROSCOPY
OPTICAL MODES
OSCILLATION MODES
PHOTONS
SCANNING LIGHT MICROSCOPY
WAVEGUIDES