Photon scanning tunneling microscopy

Journal Article · Sat Dec 01 04:00:00 EST 1990 · Review of Scientific Instruments; (USA)

DOI:https://doi.org/10.1063/1.1141534· OSTI ID:6218900

Reddick, R C; Warmack, R J; Chilcott, D W; Sharp, S L; Ferrell, T L ^[1]

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1. Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, TN (USA) Department of Physics and Astronomy, University of Tennessee, Knoxville, TN (USA)

An optical tunneling microscope is presented that operates in exactly the same way as the electron scanning tunneling microscope (ESTM). It takes advantage of evanescent fields generated by the total internal reflection (TIR) of light at the interface between materials of different optical densities. The photon scanning tunneling microscope (PSTM) employs an optically conducting probe tip to map spatial variations in the evanescent and scattered field intensity distributions adjacent to a sample surface, which forms or is placed on the TIR surface. These variations are due to the local topography, morphology, and optical activity of the surface and form the basis of imaging. Evanescent field theory is discussed and the evanescent field intensity as a function of surface-probe separation is calculated using several probe tip models. After a description of PSTM construction and operation, evanescent field intensity measurements are shown to agree with the model calculations. PSTM images of various sample surfaces demonstrate subwavelength resolution exceeding that of conventional optical microscopy, especially in the vertical dimension. Limitations and interpretation of PSTM images are discussed as well as the PSTMs applicability to other forms of surface analysis.

• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6218900
• Journal Information: Review of Scientific Instruments; (USA), Journal Name: Review of Scientific Instruments; (USA) Vol. 61:12; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

440600* -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
COMPARATIVE EVALUATIONS
DESIGN
ELEMENTARY PARTICLES
FIBERS
INTERFACES
MASSLESS PARTICLES
MATHEMATICAL MODELS
MICROSCOPES
OPTICAL FIBERS
OPTICAL MICROSCOPES
PERFORMANCE
PHOTONS
TUNNELING