Photo-ion spectrometer
Patent
·
OSTI ID:7117649
A thin film structure for providing predetermined electric field boundary conditions. A thin film configuration is disposed on an insulator substrate in a selected spatial pattern with substantially uniform electrically resistive character in each of the different areas of the spatial pattern.
- DOE Contract Number:
- W-31109-ENG-38
- Assignee:
- ARCH Development Corp., Chicago, IL (United States)
- Patent Number(s):
- A; US 5097125
- Application Number:
- PPN: US 7-045586
- OSTI ID:
- 7117649
- Country of Publication:
- United States
- Language:
- English
Similar Records
Photo ion spectrometer
Photo ion spectrometer
Photo ion spectrometer
Patent
·
Tue Dec 31 23:00:00 EST 1991
·
OSTI ID:868195
Photo ion spectrometer
Patent
·
Sat Dec 31 23:00:00 EST 1988
·
OSTI ID:867069
Photo ion spectrometer
Patent
·
Sat Dec 31 23:00:00 EST 1988
·
OSTI ID:867096
Related Subjects
440800* -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
DESIGN
DISTRIBUTION
ELECTRIC CONDUCTIVITY
ELECTRIC FIELDS
ELECTRIC POTENTIAL
ELECTRICAL EQUIPMENT
ELECTRICAL INSULATORS
ELECTRICAL PROPERTIES
EQUIPMENT
FILMS
MEASURING INSTRUMENTS
PHYSICAL PROPERTIES
SPATIAL DISTRIBUTION
SPECTROMETERS
THIN FILMS
47 OTHER INSTRUMENTATION
DESIGN
DISTRIBUTION
ELECTRIC CONDUCTIVITY
ELECTRIC FIELDS
ELECTRIC POTENTIAL
ELECTRICAL EQUIPMENT
ELECTRICAL INSULATORS
ELECTRICAL PROPERTIES
EQUIPMENT
FILMS
MEASURING INSTRUMENTS
PHYSICAL PROPERTIES
SPATIAL DISTRIBUTION
SPECTROMETERS
THIN FILMS