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The Effect of High-Resistance SnO2 on CdS/CdTe Device Performance

Conference ·
OSTI ID:7100

In this paper, we have studied the effect of high-resistance SnO2 buffer layers, deposited by low-pressure chemical-vapor deposition, on CdS/CdTe device performance. Our results indicate that when CdS/CdTe devices have a very thin layer of CdS or no CdS at all, the i-SnO2 buffer layer helps to increase device efficiency. When the CdS layer is thicker than 600{angstrom}, the device performance is dominated by CdS thickness, not the i-SnO2 layer. If a very thin CdS layer is to be used to enhance device performance, we conclude that a better SnO2 buffer layer is needed.

Research Organization:
National Renewable Energy Lab., Golden, CO (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
AC36-83CH10093
OSTI ID:
7100
Report Number(s):
NREL/CP-520-25607; ON: DE00007100
Country of Publication:
United States
Language:
English

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