Stand-off transmission lines and method for making same
Standoff transmission lines in an integrated circuit structure are formed by etching away or removing the portion of the dielectric layer separating the microstrip metal lines and the ground plane from the regions that are not under the lines. The microstrip lines can be fabricated by a subtractive process of etching a metal layer, an additive process of direct laser writing fine lines followed by plating up the lines or a subtractive/additive process in which a trench is etched over a nucleation layer and the wire is electrolytically deposited. Microstrip lines supported on freestanding posts of dielectric material surrounded by air gaps are produced. The average dielectric constant between the lines and ground plane is reduced, resulting in higher characteristic impedance, less crosstalk between lines, increased signal propagation velocities, and reduced wafer stress. 16 figures.
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- University of California, Oakland, CA (United States)
- Patent Number(s):
- US 5017509; A
- Application Number:
- PPN: US 7-555814
- OSTI ID:
- 7083858
- Resource Relation:
- Patent File Date: 18 Jul 1990
- Country of Publication:
- United States
- Language:
- English
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