Fundamental surface chemistry of GaAs OMVPE
Conference
·
OSTI ID:70821
Organometallic and hydride compounds are widely used as precursors for the epitaxial growth of GaAs and other compound semiconductors. These precursors are most commonly used to perform organometallic vapor phase epitaxy (OMVPE) and also in related deposition techniques such as atomic layer epitaxy (ALE) and metalorganic molecular beam epitaxy (MOMBE). We have investigated the surface chemical properties of these precursors on GaAs(100) using a variety of surface science diagnostics. Results have shed light on the mechanisms of precursor decomposition which lead to film growth and carbon doping. For instance, kinetics of trimethylgallium (TMGa) decomposition on the Ga-rich and As-rich surfaces, measured by TPD, are in semiquantitative agreement with ALE results; indicating that the dominant growth mechanism during ALE is heterogeneous. Furthermore, there is no compelling evidence for the production of methane (CH{sub 4}) on the GaAs surface when TMGa and arsine (AsH{sub 3}) are coadsorbed.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 70821
- Report Number(s):
- SAND--95-0848C; CONF-9505216--1; ON: DE95011606
- Country of Publication:
- United States
- Language:
- English
Similar Records
Reactive chemical intermediates in metalorganic chemical vapor deposition of GaAs
Device quality AlGaAs/GaAs heterostructures grown in a multichamber organometallic vapor phase epitaxial apparatus
Mechanism of carbon incorporation during GaAs epitaxy
Journal Article
·
Mon Oct 12 00:00:00 EDT 1992
· Applied Physics Letters; (United States)
·
OSTI ID:6916704
Device quality AlGaAs/GaAs heterostructures grown in a multichamber organometallic vapor phase epitaxial apparatus
Journal Article
·
Sun Apr 06 23:00:00 EST 1986
· Appl. Phys. Lett.; (United States)
·
OSTI ID:6081230
Mechanism of carbon incorporation during GaAs epitaxy
Journal Article
·
Thu Jul 01 00:00:00 EDT 1993
· Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States)
·
OSTI ID:6266280