Soft-x-ray-emission studies of bulk Fe sub 3 Si, FeSi, and FeSi sub 2 , and implanted iron silicides

Journal Article · Thu Oct 15 00:00:00 EDT 1992 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.46.9446· OSTI ID:7080309

Jia, J J; Callcott, T A; O'Brien, W L; Dong, Q Y ^[1]; Mueller, D R; Ederer, D L ^[2]; Tan, Z; Budnick, J I ^[3]

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1. University of Tennessee, Knoxville, Tennessee 37996 (United States)
2. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
3. University of Connecticut, Storrs, Connecticut 06269 (United States)

Bulk iron silicides and implanted iron silicides have been studied by soft-x-ray emission (SXE) spectroscopy. The Si {ital L}{sub 2,3} emission spectra of these materials are measured. For bulk silicides, these spectra provide a measure of {ital s}- and {ital d}-type partial density of states (PDOS) localized on the Si sites. We compare them with available band-structure calculations and also with photoemission measurements. For implanted systems, the Si {ital L}{sub 2,3} emission spectra provide useful information about the silicide formation process with the variation of implant doses.

• DOE Contract Number: AC02-76CH00016
• OSTI ID: 7080309
• Journal Information: Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 46:15; ISSN PRBMD; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
ALLOYS
CHEMICAL ANALYSIS
EMISSION
ION IMPLANTATION
IRON ADDITIONS
IRON ALLOYS
IRON COMPOUNDS
IRON SILICIDES
NONDESTRUCTIVE ANALYSIS
PHOTOEMISSION
SECONDARY EMISSION
SILICIDES
SILICON COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
X-RAY EMISSION ANALYSIS