Grain growth of rapid-thermal-annealed Y-Ba-Cu oxide superconducting thin films
A study of the microstructure of Cu-rich and stoichiometric Y-Ba-Cu oxide thin-film superconductors is presented. The films were deposited on <100> SrTiO/sub 3/ by the nonvacuum technique of metalorganic deposition followed by rapid thermal annealing in oxygen. Analysis showed that for annealing temperatures below 900 /sup 0/C, grain size increased with increased annealing temperature, with an enhancement in grain growth for the Cu-rich films. Annealing near or above the melting point of the 1-2-3 phase causes only a slight increase in the rate of grain growth and no detectable effects of the excess Cu. Annealing above 920 /sup 0/C produces segregated CuO islands 5--10 ..mu..m in size in the Cu-rich films. Oriented grain growth was found for the 1-2-3 grains with their c axis perpendicular and parallel to the SrTiO/sub 3/ substrates. Sheet resistivity measurements were correlated with grain size, phase separation, and oriented grain growth. An anomalous behavior in the resistance-temperature plot at 220--240 K of the Cu-rich films is shown to be related to the presence of the excess Cu.
- Research Organization:
- Electrical and Electronics Engineering Department, General Motors Research Laboratories, Warren, Michigan 48090-9055
- OSTI ID:
- 7078728
- Journal Information:
- Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 53:5; ISSN APPLA
- Country of Publication:
- United States
- Language:
- English
Similar Records
Microstructure study of Y--Ba--Cu oxide superconducting thin films
Ion beam sputtering of in situ superconducting Y-Ba-Cu-O films
Related Subjects
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
ALKALINE EARTH METAL COMPOUNDS
ANNEALING
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
CRYSTAL STRUCTURE
DEPOSITION
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
FILMS
GRAIN GROWTH
GRAIN SIZE
HEAT TREATMENTS
LOW TEMPERATURE
MICROSTRUCTURE
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SCATTERING
SIZE
STOICHIOMETRY
SUPERCONDUCTING FILMS
TEMPERATURE DEPENDENCE
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS
YTTRIUM OXIDES