Optical properties of mixed yttria--silica films

Journal Article · Fri Dec 15 04:00:00 EST 1989 · Applied Optics; (USA)

DOI:https://doi.org/10.1364/AO.28.005229· OSTI ID:7073822

Feldman, A; Ying, X; Farabaugh, E ^[1]

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1. U.S. National Institute of Standards Technology, Ceramics Division, Gaithersburg, Maryland 20899 (US)

The refractive indices and absorption coefficients of a series of mixed yttria--silica films prepared by electron beam codeposition have been calculated from transmission spectra. The dependence of the refractive index and film densification on composition suggests that porosity inherent in pure yttria films deposited by electron beam evaporation can be reduced by admixture with silica; however, the films show increased absorption which is attributed to oxygen deficiency. These effects are similar to those observed previously in mixed zirconia--silica films.

• OSTI ID: 7073822
• Journal Information: Applied Optics; (USA), Journal Name: Applied Optics; (USA) Vol. 28:24; ISSN 0003-6935; ISSN APOPA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
BEAMS
CHALCOGENIDES
CHEMICAL COMPOSITION
COATINGS
DEPOSITION
ELECTRON BEAMS
ENERGY BEAM DEPOSITION
ENERGY BEAM DEPOSITION FILMS
FILMS
LEPTON BEAMS
OPTICAL PROPERTIES
OXIDES
OXYGEN COMPOUNDS
PARTICLE BEAMS
PHYSICAL PROPERTIES
SILICON COMPOUNDS
SILICON OXIDES
SURFACE COATING
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
YTTRIUM OXIDES