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Synchrotron x-ray topography studies of twin structures in lanthanum aluminate single crystals

Journal Article · · Journal of Materials Research; (United States)
; ;  [1];  [2]
  1. Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794-2275 (United States)
  2. AT T Bell Laboratories, Murray Hill, New Jersey 07974 (United States)
An extensive investigation of twin structures in lanthanum aluminate single crystals at room temperature has been undertaken using White Beam Synchrotron X-ray Topography (WBSXRT). Twin configurations, directly observable via orientation contrast, were found to comprise both large-volume, macroscopic twins and thick twin lamellae. Positional shifts of twin domain images with respect to matrix images, arising from the mutual misorientation of diffraction vectors, were measured on x-ray topographic images recorded from the (220){sub rhom} planes approximately parallel to the specimen surface and compared to calculated values in order to solve the twin laws in this system. The dominant twin operations were found to be (101){sub rhom}, (011){sub rhom}, and (112){sub rhom} mirror reflections. The potential influence of the twins on the growth of epitaxial Ba{sub 2}YCu{sub 3}O{sub 7{minus}{delta}} thin films is discussed.
DOE Contract Number:
FG02-84ER45098
OSTI ID:
7068296
Journal Information:
Journal of Materials Research; (United States), Journal Name: Journal of Materials Research; (United States) Vol. 7:7; ISSN JMREE; ISSN 0884-2914
Country of Publication:
United States
Language:
English