Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunneling microscopes

Journal Article · Thu Apr 01 04:00:00 EST 1993 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1144139· OSTI ID:7066033

Vandervoort, K G; Zasadzinski, R K; Galicia, G G; Crabtree, G W ^[1]

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1. Science and Technology Center for Superconductivity and Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

We have calibrated the displacement/voltage (A/V) response of our piezoelectric scanning tube (PZT-5A) by imaging graphite at over 40 temperatures between 4 and 300 K. We have also calibrated the (A/V) response as a function of voltage up to 220 V at room temperature, imaging a gold-plated diffraction grating. We find that the temperature dependence of the (A/V) response is linear to within 10% and is reduced by a factor of 5.5 on decreasing temperature from 300 to 4.2 K. The near linearity with temperature of the (A/V) response makes the PZT-5A lead zirconate titanate composition a convenient choice for low temperature scanning tunneling microscope piezo tube elements.

• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 7066033
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 64:4; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANL
CALIBRATION
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
MICROSCOPES
MICROSCOPY
NATIONAL ORGANIZATIONS
SCANNING ELECTRON MICROSCOPY
TEMPERATURE RANGE
TEMPERATURE RANGE 0000-0013 K
TEMPERATURE RANGE 0013-0065 K
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TUNNEL EFFECT
US AEC
US DOE
US ERDA
US ORGANIZATIONS