Higher smectic-layer order parameters in liquid crystals determined by x-ray diffraction and the effect of antiferroelectricity

Journal Article · Sun Jan 01 04:00:00 EST 1995 · Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics; (United States)

DOI:https://doi.org/10.1103/PhysRevE.51.400· OSTI ID:7061318

Takanishi, Y; Ikeda, A; Takezoe, H; Fukuda, A ^[1]

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1. Department of Organic and Polymeric Materials, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152 (Japan)

By observing the higher-order Bragg peaks corresponding to the layer spacing, the smectic-layer order parameters up to the third order were obtained and the center-of-mass distribution function along the layer normal was calculated. The results clearly indicate that the smectic layer distribution is different from a sinusoidal density wave in antiferroelectric liquid crystals and that the smectic- (Sm) layer order is relatively higher in antiferroelectric Sm-[ital C][sub [ital A]][sup (*)] than in ferroelectric Sm-[ital C][sup (*)]. There exists a correlation between the stable antiferroelectricity and the higher smectic-layer order.

• OSTI ID: 7061318
• Journal Information: Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics; (United States), Journal Name: Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics; (United States) Vol. 51:1; ISSN PLEEE8; ISSN 1063-651X
• Country of Publication: United States
• Language: English

Related Subjects

665000* -- Physics of Condensed Matter-- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COHERENT SCATTERING
CRYSTAL-PHASE TRANSFORMATIONS
CRYSTALS
DIFFRACTION
FLUIDS
LIQUID CRYSTALS
LIQUIDS
ORDER PARAMETERS
PHASE TRANSFORMATIONS
SCATTERING
X-RAY DIFFRACTION