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Effect of D. C. testing water tree deteriorated cable and a preliminary evaluation of V. L. F. as alternate

Journal Article · · IEEE Transactions on Power Delivery (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/61.141878· OSTI ID:7050401
; ;  [1]; ;  [2]
  1. Cable Technology Lab., Inc., New Brunswick, NJ (US)
  2. Consolidated Edison of New York, Inc., New York, NY (US)
This paper reports that according to the experience of some power utilities, the application of industry recommended high voltage d.c. field tests on 5-35 kV extruded dielectric cables, containing water trees, sometimes causes further deterioration of the insulation. Tests conducted on laboratory aged 15 kV ethylene propylene rubber (EP) and 15 and 28 kV crosslinked polyethylene (XLPE) insulated cables indicate that d.c. proof tests in accordance with AEIC specifications an IEEE test guides without flashover do not appear to cause further deterioration. Depending on the degree of cable aging and the level of test voltage, when flashovers take place, damage may be inflicted to XLPE cables. No damage was observed on aged EP cable, at the same test levels. Because of the aforementioned power utility experience, some users have requested an alternate field proof test. Tests conducted on new XLPE and EP cables indicate that damage to the insulation structure can be detected using VLF (0.1 Hz) voltage at approximately one-third the d.c. voltage level. Field tests conducted on severely tree deteriorated 15 kV polyethylene (PE) cable using AEIC recommended d.c. voltage level of about five times operating voltage level caused cable failure; VLF voltage levels up to two times operating voltage did not. VLF voltage appears to be a suitable alternate to d.c. voltage for field proof testing.
OSTI ID:
7050401
Journal Information:
IEEE Transactions on Power Delivery (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Power Delivery (Institute of Electrical and Electronics Engineers); (United States) Vol. 7:3; ISSN 0885-8977; ISSN ITPDE
Country of Publication:
United States
Language:
English