VUV and soft x-ray properties of solids and synthetic layered materials
Thesis/Dissertation
·
OSTI ID:7044963
Optical properties are among the most important properties of solids. To understand the optical properties of materials, the variety of roles photons and electrons play when they interact with solids must be recognized. Two topics on the VUV and soft x-ray properties of solids and multilayers are chosen in this dissertation. There has not yet been any report on the emission spectra of potassium halides in the VUV and soft x-ray regime due to the difficulties involved in their measurements. The authors have measured the reflection and emission spectra of KF, KCl, KBr and KI using the same spectrometer under exactly the same experimental conditions in the energy range of 12-25 eV (Potassium 3p). The reflection spectra are used to generate absorption spectra. The [Sigma] and X excitonic features in the potassium halides are clearly seen in all the samples. Comparisons between the two spectra showed a Franck-Condon shift of as large as 1 eV. This observation allows the determination of a lower limit of the core hole life times of the halides by using a simple theoretical model. Artificially layered composite materials exhibit a variety of unusual and useful characteristics, but information regarding their interfacial properties is still very limited. The authors have developed a non-destructive procedure for determining the concentration profiles of an element at these interfaces with a spatial resolution of about 20 [angstrom], and applied this procedure to probe the structure in a series Ti-Si multilayer samples. The authors also compared the changes in the distribution functions of the compositional materials before and after annealing to characterize the interdiffusion in multilayers. Although with limited resolution, this procedure provides a fair and useful measure of the interfacial profiles and it will open up a new possibility in determining the atomic distribution functions in a wide variety of synthetic layered materials.
- Research Organization:
- Oregon Univ., Eugene, OR (United States)
- OSTI ID:
- 7044963
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
664200 -- Spectra of Atoms & Molecules & their Interactions with Photons-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
ALKALI METAL COMPOUNDS
BROMIDES
BROMINE COMPOUNDS
CHLORIDES
CHLORINE COMPOUNDS
ELECTROMAGNETIC RADIATION
ELEMENTS
FLUORIDES
FLUORINE COMPOUNDS
FRANCK-CONDON PRINCIPLE
HALIDES
HALOGEN COMPOUNDS
INORGANIC PHOSPHORS
IODIDES
IODINE COMPOUNDS
IONIZING RADIATIONS
LAYERS
METALS
OPTICAL PROPERTIES
PHOSPHORS
PHYSICAL PROPERTIES
POTASSIUM BROMIDES
POTASSIUM CHLORIDES
POTASSIUM COMPOUNDS
POTASSIUM FLUORIDES
POTASSIUM IODIDES
RADIATIONS
SEMIMETALS
SILICON
SOFT X RADIATION
TITANIUM
TRANSITION ELEMENTS
ULTRAVIOLET RADIATION
X RADIATION
360606* -- Other Materials-- Physical Properties-- (1992-)
664200 -- Spectra of Atoms & Molecules & their Interactions with Photons-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
ALKALI METAL COMPOUNDS
BROMIDES
BROMINE COMPOUNDS
CHLORIDES
CHLORINE COMPOUNDS
ELECTROMAGNETIC RADIATION
ELEMENTS
FLUORIDES
FLUORINE COMPOUNDS
FRANCK-CONDON PRINCIPLE
HALIDES
HALOGEN COMPOUNDS
INORGANIC PHOSPHORS
IODIDES
IODINE COMPOUNDS
IONIZING RADIATIONS
LAYERS
METALS
OPTICAL PROPERTIES
PHOSPHORS
PHYSICAL PROPERTIES
POTASSIUM BROMIDES
POTASSIUM CHLORIDES
POTASSIUM COMPOUNDS
POTASSIUM FLUORIDES
POTASSIUM IODIDES
RADIATIONS
SEMIMETALS
SILICON
SOFT X RADIATION
TITANIUM
TRANSITION ELEMENTS
ULTRAVIOLET RADIATION
X RADIATION