Ultrahigh vacuum chamber for synchrotron x-ray diffraction from films adsorbed on single-crystal surfaces

Journal Article · Sat Aug 01 00:00:00 EDT 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1143279· OSTI ID:7037600

Dennison, J R ^[1]; Wang, S; Dai, P; Angot, T; Taub, H ^[2]; Ehrlich, S N ^[3]

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1. Department of Physics, Utah State University, Logan, Utah 84322 (United States)
2. Department of Physics and Astronomy, University of Missouri-Columbia, Columbia, Missouri 65211 (United States)
3. School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907 (United States)

An ultrahigh vacuum chamber has been developed for structural analysis of adsorbed films and single-crystal surfaces using synchrotron x-ray diffraction. It is particularly well suited for investigations of physisorbed and other weakly bound films. The chamber is small enough to transport and mount directly on a standard four-axis diffractometer and can also be used independently of the x-ray diffractometer. A low-current, pulse-counting, low-energy electron diffraction/Auger spectroscopy system with a position-sensitive detector enables {ital in} {ital situ} characterization of the film and substrate while the sample is located at the x-ray scattering position. A closed-cycle He refrigerator and electron bombardment heater provide controlled substrate temperatures from 30 to 1300 K. The chamber is also equipped with an ion sputter gun, a quadrupole mass spectrometer, and a gas handling system. Details of the design and operation of the instrument are described. To demonstrate the performance of the instrument, we present some preliminary results of a study of Xe physisorbed on the Ag(111) surface.

• DOE Contract Number: FG02-85ER45183
• OSTI ID: 7037600
• Journal Information: Review of Scientific Instruments; (United States), Vol. 63:8; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
SAMPLE HOLDERS
DESIGN
X-RAY DIFFRACTION
OPERATION
SYNCHROTRON RADIATION
ULTRAHIGH VACUUM
VACUUM SYSTEMS
BREMSSTRAHLUNG
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
RADIATIONS
SCATTERING
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments