Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface

Journal Article · Mon Jan 31 04:00:00 EST 1994 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.72.685· OSTI ID:5226168

Dai, P; Angot, T; Ehrlich, S N; Wang, S; Taub, H ^[1]

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1. Department of Physics and Astronomy, University of Missouri-Columbia, Columbia, Missouri 65211 (United States) School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907 (United States)

Synchrotron x-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe-Xe spacing is reached at monolayer completion and fcc films of thickness [ge]220 A are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the Xe/vacuum interface as well as a direct determination of the film's thickness and layer spacings.

• DOE Contract Number: FG02-85ER45183
• OSTI ID: 5226168
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 72:5; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ADSORPTION
BREMSSTRAHLUNG
COHERENT SCATTERING
CRYSTAL GROWTH
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CUBIC LATTICES
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTS
FCC LATTICES
FLUIDS
GASES
INTERFACES
LATTICE PARAMETERS
NONMETALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATIONS
RARE GASES
REFLECTIVITY
SCATTERING
SORPTION
SURFACE PROPERTIES
SYNCHROTRON RADIATION
TEMPERATURE DEPENDENCE
TIME DEPENDENCE
X-RAY DIFFRACTION
XENON